feat: Add deterministic truncated-Laplace noise to TrusTEE - #4279
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Wire DETERMINISTIC_TRUNCATED_LAPLACE into the TrusTEE reach/frequency computation. Noise is drawn per EDP, seeded from a SHA-256 fingerprint of each EDP's frequency vector, summed across EDPs; thresholds are applied post-noise. - Add DETERMINISTIC_TRUNCATED_LAPLACE to the internal duchy NoiseMechanism and truncation_bound to trus_tee.proto Parameters. - Thread noise_mechanism and truncation_bound through TrusTeeParams. - Add DeterministicTruncatedLaplaceNoise: builds a 0..maxFrequency histogram and noises it; reach derives from bucket 0, frequency reuses computeFrequencyDistribution with noise turned off. - TrusTeeProcessorImpl fingerprints each EDP vector at ingest and branches to the deterministic path; the Gaussian path is unchanged.
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Adds the
DETERMINISTIC_TRUNCATED_LAPLACEnoise mechanism to the TrusTEE reach/frequency computation. Rest of Component B (sampler is #4188, public API is 0.96.0).Noise: one truncated-Laplace draw per output, seeded from a SHA-256 fingerprint of the aggregate frequency vector. Reach and frequency draw from their own DP params (
reach_dp_params/frequency_dp_params); sensitivity is 1. Because the seed is the aggregate, the noise is reproducible and identical no matter how many EDP vectors were summed to produce it.Per-vector suppression (DTLN only): a contribution whose own reach is below
min_usersis dropped before aggregation, so a sub-threshold marginal can't be recovered by differencing overlapping regions.Changes:
NoiseMechanismgainsDETERMINISTIC_TRUNCATED_LAPLACE;trus_tee.protoParametersgains aDeterministicTruncatedLaplaceNoiseParamsmessage (holdingtruncation_bound), mirroring the public API.DeterministicTruncatedLaplaceNoise(fingerprint + noise).SampledReachAndFrequency(reach + histogram).computeReachgains an overload on it; the existingLongArrayoverload delegates to it, so the Direct builders and their tests are unchanged.TrusTeeProcessorImplbranches to the new noiser; the Gaussian path is unchanged.Tests: noiser unit tests (determinism, draw structure, clamping) and processor tests (deterministic result is reproducible, independent of the EDP split, and drops sub-threshold vectors).
Issue: NA